Facilities





Spin- polarized Electron Spectroscope  

・We can detect the energy and spin-polarization of the electron emitted from a sample.
In addition, we can also detect the composition and the crystallographic structure of the sample.
・The sample can be kept in the ultrahigh vacuum of 1/10,000,000,000,000 of the atmospheric pressure, and the sample tempareture can be controlled from 150K to 1000K.
・By using this apparatus, we are studying the magnetic properties of the surfaces, and the ultrathin films.

   
AFM/MFM Veeco NanoScope Ⅲ 

We can obtain the surface topography of a sample with several-nanometer resolution in AFM mode as well as the magnetic stray field distribution on a sample surface with several tens nanometer scale in MFM mode. 
   

Low temperature UHV-STM/AFM  Unisoku USM-1300A-A3

・We can observe the surface topography of a sample with atomic resolution under  conditions of high magnetic fields and cryogenic temperature by this STM/AFM.
・sample temperature: 2～400 K
・Magnetic field: -8 ～8 T
・Sample cleaning: sputter ion gun
・vacuum pressure: 5x10-11 Torr
   



Spin SEM

・We can cbserve the magnetization vector distribution with a spatial resolution of 3nm.Inaddition, we can also observe the elements and the crystallographic direction distribution of the same area as we observe the magnitization.
・The sample tempareture can be contreolled from 10K to 400K.
・By using this apparatus, we are studying the magnetic properties of the surfaces, the ultrathin films and the nano-structured samples. 
LT-STM/AFM

・Surface structure of the conductor and the insulator can be observed with atomic resolution.
・Density of states can be detected by STS.
・Sample Tempreture:4K～400K
・Vacuum pressure: 5×10-11 Torr 
   
SEM with 4-Probe System

・Various kinds of properties related to electric conductivity can be studied for nano-structured material without putting electrode by nano-fablication.
・Sample Tempreture:30K - room temperature
・Vacuum pressure: 1×10-10 Torr
・Spatial Resolution:3 nm
・Function of STM
   
PPMS

・Erectric conductivity, heat capasity, Seebeck coefficient, magnetization, torque, and magnetic permeability can be measured.
・Sample Tempreture:2K～400K
・Magnetic Field : 0～±14T  
   

Homemade Kerr microscopy

・Magnetic domain structure of a sample surface can be imaged using one of three magnetization components with this Kerr microscopy.
・Magnetic field: －1～1 T
・Sample temperature: RT～200℃
   
 

Homemade MOKE

・It is possible to measure the hysteresis loop of a local area on a magnetic sample using this MOKE system.
・Magnetic field：－500～500 Oe
・Beam diameter：＜5 μm