Facilities
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Spin- polarized Electron Spectroscope ・We can detect the energy and spin-polarization of the electron emitted
from a sample. |
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AFM/MFM Veeco NanoScope V We can obtain the surface topography of a sample with several-nanometer resolution in AFM mode as well as the magnetic stray field distribution on a sample surface with several tens nanometer scale in MFM mode. |
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Low temperature UHV-STM/AFM Unisoku USM-1300A-A3 ・We can observe the surface topography of a sample with atomic resolution
under conditions of high magnetic fields and cryogenic temperature
by this STM/AFM. |
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Spin SEM ・We can cbserve the magnetization vector distribution with a spatial resolution of 3nm.Inaddition, we can also observe the elements and the crystallographic direction distribution of the same area as we observe the magnitization. ・The sample tempareture can be contreolled from 10K to 400K. ・By using this apparatus, we are studying the magnetic properties of the surfaces, the ultrathin films and the nano-structured samples. |
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LT-STM/AFM ・Surface structure of the conductor and the insulator can be observed with atomic resolution. ・Density of states can be detected by STS. ・Sample Tempreture:4K〜400K ・Vacuum pressure: 5×10-11 Torr |
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SEM with 4-Probe System |
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PPMS ・Erectric conductivity, heat capasity, Seebeck coefficient, magnetization, torque, and magnetic permeability can be measured. ・Sample Tempreture:2K〜400K ・Magnetic Field : 0〜±14T |
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Homemade Kerr microscopy ・Magnetic domain structure of a sample surface can be imaged using one
of three magnetization components with this Kerr microscopy. |
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Homemade MOKE ・It is possible to measure the hysteresis loop of a local area on a magnetic
sample using this MOKE system. |