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Spin-polarized Electron Spectroscope

Spin-polarized Electron Spectroscope

Spin-polarized Electron Spectroscope

  • By detecting the energy and spin-polarization of the electrons emitted from a sample,
    we study the magnetism of surfaces and ultra-thin films.
  • Vacuum Pressure:1~10^(-10) Torr
  • Sample Temperature:150 K`1000 K
  • Element AnalysisFAES
  • Crystal Analysis: LEED
  • Sample CleaningFIon Gun
  • Evaporator & Film Thickness Monitor are equipped.

AFM/MFM Veeco NanoScope ‡V

AFM/MFM Veeco NanoScope ‡V

AFM/MFM Veeco NanoScope ‡V

  • We can obtain the surface topography of a sample with several-nanometer resolution in AFM mode as well as the magnetic stray field distribution on a sample surface with several tens nanometer scale in MFM mode.

Low temperature UHV-STM/AFM Unisoku USM-1300A-A3

Low temperature UHV-STM/AFM  Unisoku USM-1300A-A3

Low temperature UHV-STM/AFM Unisoku USM-1300A-A3

  • We can observe the surface topography of a sample with atomic resolution under conditions of high magnetic fields and cryogenic temperature by this STM/AFM.
  • Magnetic Field: -8 `8 T
  • Sample Temperature: 2`400 K
  • Sample Cleaning: Sputter Ion Gun
  • Vacuum Pressure: 5x10-11 Torr

Spin SEM

Spin SEM

Spin SEM

  • We can cbserve the magnetization vector distribution with a spatial resolution of 3nm.
  • Inaddition, we can also observe the elements and the crystallographic direction distribution of the same area as we observe the magnitization.
  • The sample tempareture can be contreolled from 10K to 400K.
  • By using this apparatus, we are studying the magnetic properties of the surfaces, the ultrathin films and the nano-structured samples.

LT-STM/AFM

LT-STM/AFM

LT-STM/AFM

  • Surface structure of the conductor and the insulator can be observed with atomic resolution.
  • Density of states can be detected by STS.
  • Sample Tempreture:4K`400K
  • Vacuum Pressure: 5~10-11 Torr

SEM with 4-Probe System

SEM with 4-Probe System

SEM with 4-Probe System

  • Various kinds of properties related to electric conductivity can be studied for nano-structured material without putting electrode by nano-fablication.
  • Sample Tempreture:30K - room temperature
  • Vacuum Pressure: 1~10-10 Torr
  • Spatial Resolution:3 nm
  • Function of STM

PPMS

PPMS

PPMS

  • Erectric conductivity, heat capasity, Seebeck coefficient, magnetization, torque, and magnetic permeability can be measured.
  • Sample Tempreture:2K`400K
  • Magnetic Field : 0`}14T

Homemade Kerr microscopy

Homemade Kerr microscopy

Homemade Kerr microscopy

  • Magnetic domain structure of a sample surface can be imaged using one of three magnetization components with this Kerr microscopy.
  • Magnetic Field: |1`1 T
  • Sample Temperature: RT`200Ž

Homemade MOKE

Homemade MOKE

Homemade MOKE

  • It is possible to measure the hysteresis loop of a local area on a magnetic sample using this MOKE system.
  • Magnetic FieldF|500`500 Oe
  • Beam DiameterFƒ5 ƒÊm

FZ Single Crystal Growth Machine

FZ Single Crystal Growth Machine

  • TemperatureF~2100Ž
  • Lower Axis StrokeFMax. 150 mm

  • Upper Axis StrokeFMax. 150 mm

  • Growth VelocityF1.0~20.0 mm/h
  • Main Axis RotationF6~60 rpm

Ultra High Vacuum STM

Ultra High Vacuum STM

  • Sample CleaningFIon Gun
  • Element AnalysisFAES

  • Vacuum PressureF1~10-11 Torr

Multi-Purpose Ultra High Vacuum Chamber

Multi-Purpose Ultra High Vacuum Chamber

  • Vacuum PressureF1~10-10Torr

Evaporator

Evaporator

  • Vacuum PressureF1~10-5Torr
  • Heating CurrentF50 A

Spot Welder/Crystal Cutter/Polisher

Spot Welder/Crystal Cutter/Polisher

Spin & Nano Physics GroupDivision of Physics, Faculty of Science, Hokkaido University
Kita 10 Nishi 8,Kita-ku,Sapporo,Hokkaido,JAPAN
Tel/FaxF011-706-2685@E-mailFkoike—phys.sci.hokudai.ac.jp
  • Hokkaido University
  • Open Facility
  • CRIS